RRB JE CBT 2 - Electronics study plan

Derive and sketch the V-I characteristics of PN junction diodes, Zener diodes, and BJTs from memory, labeling knee voltage, breakdown region, and saturation/cutoff regions.

Solve 25 numerical problems on diode biasing, static and dynamic resistance, and BJT current gains (alpha, beta, gamma) showing each step.

State and apply semiconductor fundamentals: intrinsic vs extrinsic carrier concentration, doping, drift and diffusion current, and depletion width dependence on bias.

Refresh the mathematics toolkit needed for electronics: logarithms for decibels, complex numbers for impedance, and basic differentiation for small-signal analysis.

Analyze CE, CB, and CC amplifier configurations for current gain, voltage gain, input and output impedance, and phase relationship, and tabulate the comparison.

Compute Q-point, load line, and voltage gain for fixed-bias, collector-feedback, and voltage-divider bias circuits using worked numericals.

Explain the operation of feedback amplifiers, classify oscillator circuits (RC phase shift, Hartley, Colpitts, crystal), and identify the Barkhausen criterion in each.

Calculate power gain, efficiency, and distortion figures for Class A, B, AB, and C power amplifiers.

Convert between number systems (binary, octal, decimal, hexadecimal, BCD) and perform 2's complement arithmetic without error on 20 practice conversions.

Minimize Boolean expressions using Karnaugh maps up to 4 variables and verify each result with algebraic simplification.

Design and truth-table combinational circuits: half/full adder, subtractor, multiplexer, demultiplexer, encoder, and decoder.

Compare flip-flop types (SR, JK, D, T), draw timing diagrams, and trace the output of a 4-bit ripple and synchronous counter.

Derive expressions for modulation index, sideband power, and bandwidth in AM, and compute them for given carrier and modulating signals.

Compare AM, FM, and PM on bandwidth, noise immunity, and power efficiency, and calculate deviation ratio and Carson's rule bandwidth for FM.

Explain sampling theorem, quantization, PCM, and delta modulation, and compute bit rate and quantization error for given parameters.

Identify block-level functions in transmitters, receivers, superheterodyne receivers, and multiplexing (FDM/TDM) systems.

Describe the 8085 architecture: registers, ALU, flag register, pin diagram, and timing states, and trace a simple instruction through fetch-decode-execute.

Write and hand-assemble 10 short 8085 programs (addition, subtraction, data transfer, looping, delay), listing opcodes and memory addresses.

Distinguish microprocessor from microcontroller, and compare 8051 features: ports, timers, interrupts, and memory organization.

Explain power devices and applications: SCR, TRIAC, DIAC, UJT firing circuits, rectifiers, and basic SMPS/UPS block diagrams.

Apply KVL, KCL, mesh and nodal analysis to at least 15 DC networks, and verify answers using superposition and Thevenin/Norton equivalents.

Solve AC circuit problems involving RLC series/parallel resonance, power factor, and three-phase star-delta relationships.

Explain the construction and working of PMMC, moving-iron, electrodynamometer, and digital multimeters, and compute loading and accuracy errors.

Describe CRO block diagram, deflection sensitivity, and measurement of frequency, phase, and amplitude using a CRO.

Explain computer organization basics: CPU, memory hierarchy, input/output, number representation, and operating system functions, and answer 20 recall questions.

Write and dry-run simple programs in C covering loops, arrays, and functions, and trace output for 10 code snippets.

Review current affairs of the last 6 months in science, technology, railways, and national events, and note 50 key facts.

Practice reasoning sets: series, coding-decoding, blood relations, syllogism, and seating arrangement, targeting 30 questions in 30 minutes.

Take three full-length timed mock tests simulating CBT 2 conditions and record section-wise accuracy.

Re-solve every previously missed numerical from weeks 1-7 and classify errors as concept, calculation, or misreading.

Revise all personal formula sheets and circuit diagrams in a single rapid pass, reciting key relations aloud.

Attempt a final weak-area sprint on the two lowest-scoring domains from mock analysis.